Recent introduction of the Open Semiconductor Test Architecture (OPENSTARTM) by the Semiconductor Test Consortium and on-going proliferation of the modular instrumentation and measurement systems in the area of industrial automation, including testing (in particular, mixed-signal device testing) make it necessary to look at and perhaps to revise the contents of the electronic test education programs of tertiary institutions. Even though the instrumentation and measurement systems and Automatic Test Equipment (ATE) are close to each other in terms of their target functions, there are still quite different in their implementation, characteristics and application. And both the commonalities and differences have to be addressed when designing and delivering undergraduate and graduate courses on electronic test technology and practical test engineering.