"Reviewers,"
Electronic Design, Test and Applications, IEEE International Workshop on, pp. xvi, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.
BibTex
x
@article{
10.1109/DELTA.2006.76, author = {}, title = {Reviewers}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2006}, isbn = {0-7695-2500-8}, pages = {xvi}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.76}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Reviewers SN - 0-7695-2500-8 SP EP PY - 2006 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -
Citation:
"Reviewers," delta, pp.xvi, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
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