Compact Gray-Code Counter/Memory Circuits for Spiking Pixels

January 23-January 25

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http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.115

4th IEEE International Symposium on E ...

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	ASCII Text	x
	Kwan Ting Ng, Chen Shoushun, Farid Boussaid, Amine Bermak, "Compact Gray-Code Counter/Memory Circuits for Spiking Pixels," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 506-511, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008.

	BibTex	x
	@article{ 10.1109/DELTA.2008.115, author = {Kwan Ting Ng and Chen Shoushun and Farid Boussaid and Amine Bermak}, title = {Compact Gray-Code Counter/Memory Circuits for Spiking Pixels}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3110-6}, pages = {506-511}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.115}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Compact Gray-Code Counter/Memory Circuits for Spiking Pixels SN - 978-0-7695-3110-6 SP506 EP511 A1 - Kwan Ting Ng, A1 - Chen Shoushun, A1 - Farid Boussaid, A1 - Amine Bermak, PY - 2008 KW - Counter/memory KW - spiking pixel KW - CMOS image sensor VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

In this paper, novel compact counter/memory circuits are proposed for spiking pixels. The proposed in-pixel circuits combine digitizing and memory functions, and use Gray code to limit switching activity and read-out error. Three possible implementations are proposed to meet the requirements of speed, pixel fill-factor and dynamic range.

Index Terms:

Counter/memory, spiking pixel, CMOS image sensor

Citation:

Kwan Ting Ng, Chen Shoushun, Farid Boussaid, Amine Bermak, "Compact Gray-Code Counter/Memory Circuits for Spiking Pixels," delta, pp.506-511, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008

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