A Test Data Compression Method for System-on-a-Chip

January 23-January 25

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http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.30

4th IEEE International Symposium on E ...

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	Jianhua Feng, Guoliang Li, "A Test Data Compression Method for System-on-a-Chip," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 270-273, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008.

	BibTex	x
	@article{ 10.1109/DELTA.2008.30, author = {Jianhua Feng and Guoliang Li}, title = {A Test Data Compression Method for System-on-a-Chip}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3110-6}, pages = {270-273}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.30}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - A Test Data Compression Method for System-on-a-Chip SN - 978-0-7695-3110-6 SP270 EP273 A1 - Jianhua Feng, A1 - Guoliang Li, PY - 2008 KW - Test data compression KW - FDR code KW - Hybrid Run-length code KW - MFDR code VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Jianhua Feng

Guoliang Li

This paper presents a novel and efficient code, named MFDR(Modified Frequency-Directed Run-length), for test data compression. The proposed code is a class of variable-to-variable-length prefix code. Both theoretical analysis and experimental results indicate that when the probability of 0s in the test set is greater than 0.8565, it can acquire better compression efficiency than FDR code, and compared to Hybrid Run-length code, the point is 0.8794.

Index Terms:

Test data compression, FDR code, Hybrid Run-length code, MFDR code

Citation:

Jianhua Feng, Guoliang Li, "A Test Data Compression Method for System-on-a-Chip," delta, pp.270-273, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008

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