Equivalent IDDQ Tests for Systems with Regulated Power Supply

Arlington, Virginia, USA October 04-October 06

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http://doi.ieeecomputersociety.org/10.1109/DFT.2006.28

21st IEEE International Symposium on ...

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	Chuen-Song Chen, Jien-Chung Lo, Tian Xia, "Equivalent IDDQ Tests for Systems with Regulated Power Supply," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 291-299, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006.

	BibTex	x
	@article{ 10.1109/DFT.2006.28, author = {Chuen-Song Chen and Jien-Chung Lo and Tian Xia}, title = {Equivalent IDDQ Tests for Systems with Regulated Power Supply}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2006}, issn = {1550-5774}, pages = {291-299}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.28}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Equivalent IDDQ Tests for Systems with Regulated Power Supply SN - 1550-5774 SP291 EP299 A1 - Chuen-Song Chen, A1 - Jien-Chung Lo, A1 - Tian Xia, PY - 2006 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Chuen-Song Chen, University of Rhode Island, USA

Jien-Chung Lo, University of Rhode Island, USA

Tian Xia, University of Vermont, USA

This paper presents an equivalent current sensing technique for the applications of IDDQ tests. This is accomplished by monitoring the operations of existing on-chip voltage regulators, which indirectly provides the IDDQ information. Equivalent IDDQ information is obtained by measuring an internal voltage signal of a regulator. Then, the measured data is shifted out using the IEEE 1149.1 standard. IDDQ based test methods are used to postprocess those data for screening defective circuits. Experiments were successfully conducted assuming the TSMC 0.18?m CMOS technology.

Citation:

Chuen-Song Chen, Jien-Chung Lo, Tian Xia, "Equivalent IDDQ Tests for Systems with Regulated Power Supply," dft, pp.291-299, 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'06), 2006

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