Weidong Kuang, Casto Manuel Ibarra, Peiyi Zhao,
"Soft Error Hardening for Asynchronous Circuits,"
Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 273-281, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.
BibTex
x
@article{
10.1109/DFT.2007.15, author = {Weidong Kuang and Casto Manuel Ibarra and Peiyi Zhao}, title = {Soft Error Hardening for Asynchronous Circuits}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2885-6}, pages = {273-281}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.15}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Soft Error Hardening for Asynchronous Circuits SN - 0-7695-2885-6 SP273 EP281 A1 - Weidong Kuang, A1 - Casto Manuel Ibarra, A1 - Peiyi Zhao, PY - 2007 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -
Weidong Kuang, University of Texas Pan American, Edinburg
Weidong Kuang, Casto Manuel Ibarra, Peiyi Zhao, "Soft Error Hardening for Asynchronous Circuits," dft, pp.273-281, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
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