Michele Favalli,
"Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth,"
Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 170-178, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.
BibTex
x
@article{
10.1109/DFT.2007.18, author = {Michele Favalli}, title = {Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2885-6}, pages = {170-178}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.18}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth SN - 0-7695-2885-6 SP170 EP178 A1 - Michele Favalli, PY - 2007 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -
Michele Favalli, "Delay Fault Detection Problems in Circuits Feautring a Low Combination Depth," dft, pp.170-178, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
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