"20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright,"
Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. iv, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
BibTex
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@article{
10.1109/DFTVS.2005.1, author = {}, title = {20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2005}, isbn = {0-7695-2464-8}, pages = {iv}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.1}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright SN - 0-7695-2464-8 SP EP PY - 2005 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -
Citation:
"20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Copyright," dft, pp.iv, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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