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On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors
Monterey, California October 03-October 05
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.5320th IEEE International Symposium on ...
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E. S?nchez, M. Sonza Reorda, G. Squillero, "On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 494-504, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005.
 
 
BibTex
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@article{ 10.1109/DFTVS.2005.53,
author = {E. S?nchez and M. Sonza Reorda and G. Squillero},
title = {On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2464-8},
pages = {494-504},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.53},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors
SN - 0-7695-2464-8
SP494
EP504
A1 - E. S?nchez,
A1 - M. Sonza Reorda,
A1 - G. Squillero,
PY - 2005
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
E. S?nchez, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
G. Squillero, Politecnico di Torino

In software-based self-test (SBST) a microprocessor executes a set of test programs devised for detecting the highest possible percentage of faults. The main advantages of this approach are its high defect fault coverage (being performed at-speed) and the reduced cost (since it does not require any change in the processor hardware). SBST can also be used for on-line test of a microprocessor-based system. However, some additional constraints exist in this case (e.g. in terms of test length and duration, as well as intrusiveness). This paper faces the issue of automatically transforming a test set devised for manufacturing test in a test set suitable for on-line test. Experimental results are reported on an Intel 8051 microcontroller.

Citation:
E. S?nchez, M. Sonza Reorda, G. Squillero, "On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors," dft, pp.494-504, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005
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