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Integrated Design and Test Generation Under Internet Based Environment MOSCITO
Dortmund, Germany September 04-September 06
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DSD.2002.1115368Euromicro Symposium on Digital System ...
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A. Schneider, K.-H. Diener, E. Ivask, R. Ubar, E. Gramatova, T. Hollstein, W. Kuzmicz, Z. Peng, "Integrated Design and Test Generation Under Internet Based Environment MOSCITO," Digital Systems Design, Euromicro Symposium on, pp. 187, Euromicro Symposium on Digital System Design (DSD'02), 2002.
 
 
BibTex
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@article{ 10.1109/DSD.2002.1115368,
author = {A. Schneider and K.-H. Diener and E. Ivask and R. Ubar and E. Gramatova and T. Hollstein and W. Kuzmicz and Z. Peng},
title = {Integrated Design and Test Generation Under Internet Based Environment MOSCITO},
journal ={Digital Systems Design, Euromicro Symposium on},
volume = {0},
year = {2002},
isbn = {0-7695-1790-0},
pages = {187},
doi = {http://doi.ieeecomputersociety.org/10.1109/DSD.2002.1115368},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Digital Systems Design, Euromicro Symposium on
TI - Integrated Design and Test Generation Under Internet Based Environment MOSCITO
SN - 0-7695-1790-0
SP
EP
A1 - A. Schneider,
A1 - K.-H. Diener,
A1 - E. Ivask,
A1 - R. Ubar,
A1 - E. Gramatova,
A1 - T. Hollstein,
A1 - W. Kuzmicz,
A1 - Z. Peng,
PY - 2002
KW - null
VL - 0
JA - Digital Systems Design, Euromicro Symposium on
ER -
 
A. Schneider, Fraunhofer Institute for Integrated Circuits
K.-H. Diener, Fraunhofer Institute for Integrated Circuits
E. Ivask, Tallinn Technical University
R. Ubar, Tallinn Technical University,
E. Gramatova, Institute of Informatics
T. Hollstein, Technical University of Darmstadt
W. Kuzmicz, Warsaw University of Technology
Z. Peng, Link?ping University
This paper describes an environment for internet-based collaboration in the field of design and test of digital systems. Automatic Test Pattern Generation (ATPG) and fault simulation tools at behavioral, logical and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented. The interfaces between the integrated tools and also commercial design tools were developed. The tools can be used separately, or in multiple applications in different design and test flows. The functionality of the integrated design and test system was verified in several collaborative experiments over internet by partners locating in different geographical sites.
Citation:
A. Schneider, K.-H. Diener, E. Ivask, R. Ubar, E. Gramatova, T. Hollstein, W. Kuzmicz, Z. Peng, "Integrated Design and Test Generation Under Internet Based Environment MOSCITO," dsd, pp.187, Euromicro Symposium on Digital System Design (DSD'02), 2002
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