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Third Workshop on Hot Topics in System Dependability HotDep'07
Edinburgh, UK June 25-June 28
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DSN.2007.9437th Annual IEEE/IFIP International C ...
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Miguel Castro, Microsoft Research, UK
John Wilkes, Hewlett Packard Laboratories, USA
The goals of HotDep are to bring forth cuttingedge research ideas spanning the domains of fault tolerance/ reliability and systems, and to build linkages between the two communities (e.g., between people who attend traditional "dependability" conferences such as DSN and ISSRE, and those who attend "systems" conferences such as OSDI, SOSP, and EuroSys).
Citation:
Miguel Castro, John Wilkes, "Third Workshop on Hot Topics in System Dependability HotDep'07," dsn, pp.804, 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07), 2007
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