Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices

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http://doi.ieeecomputersociety.org/10.1109/ETS.2006.10

Eleventh IEEE European Test Symposium ...

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	Kentaroh Katoh, Hideo Ito, "Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices," European Test Symposium, IEEE, pp. 69-74, Eleventh IEEE European Test Symposium (ETS'06), 2006.

	BibTex	x
	@article{ 10.1109/ETS.2006.10, author = {Kentaroh Katoh and Hideo Ito}, title = {Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices}, journal ={European Test Symposium, IEEE}, volume = {0}, year = {2006}, issn = {1530-1877}, pages = {69-74}, doi = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.10}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - European Test Symposium, IEEE TI - Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices SN - 1530-1877 SP69 EP74 A1 - Kentaroh Katoh, A1 - Hideo Ito, PY - 2006 KW - Coarse Grained Dynamically Reconfigurable Devices KW - DRP KW - BIST(Built-In Self Test) KW - DFT KW - PE. VL - 0 JA - European Test Symposium, IEEE ER -

Kentaroh Katoh, Chiba University, Japan

Hideo Ito, Chiba University, Japan

This paper proposes a BIST (Built-In Self Test) method for testing the PEs (Processing Elements) of multi-context based dynamically reconfigurable processor. We use flipflops existing in PEs to constitute the test circuit which has the function of LFSR (Linear Feedback Shift Register) and MISR (Multiple Input Signature Register) as DFT (Design For Testability). This method can reduce test execution time while maintaining the high rate of fault coverage. Evaluation of the proposed method examined on DRP-1, a coarsegrained Dynamically Reconfiguration Processor developed by NEC electronics in 2002 is presented. The number of test configurations and test execution time can be reduced 59.0% and 89.3% respectively compared to a deterministic test with 4.3% area overhead.

Index Terms:

Coarse Grained Dynamically Reconfigurable Devices, DRP, BIST(Built-In Self Test), DFT, PE.

Citation:

Kentaroh Katoh, Hideo Ito, "Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices," ets, pp.69-74, Eleventh IEEE European Test Symposium (ETS'06), 2006

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