loading...
Living with Failure: Lessons from Nature?
Southampton, United Kingdom May 21-May 21
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ETS.2006.28Eleventh IEEE European Test Symposium ...
 This Article 
 
PURCHASE ARTICLE: $0
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Steve Furber, University of Manchester, UK
The resources available on a chip continue to grow, following Moore's Law. However, the major process by which the benefits of Moore's Law accrue, which is the continuing reduction in feature size, is predicted to bring with it disadvantages in terms of device reliability and parameter variability. The problems that this will bring are underlined by the predictions from an Intel commentator: within a decade we will see 100 billion transistor chips. That is the good news. The bad news is that 20 billion of those transistors will fail in manufacture and a further 10 billion will fail in the first year of operation.
Citation:
Steve Furber, "Living with Failure: Lessons from Nature?," ets, pp.4-8, Eleventh IEEE European Test Symposium (ETS'06), 2006
Usage of this product signifies your acceptance of the Terms of Use.