A Transparent based Programmable Memory BIST

Southampton, United Kingdom May 21-May 21

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http://doi.ieeecomputersociety.org/10.1109/ETS.2006.7

Eleventh IEEE European Test Symposium ...

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	Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa, "A Transparent based Programmable Memory BIST," European Test Symposium, IEEE, pp. 89-96, Eleventh IEEE European Test Symposium (ETS'06), 2006.

	BibTex	x
	@article{ 10.1109/ETS.2006.7, author = {Slimane Boutobza and Michael Nicolaidis and Kheiredine M. Lamara and Andrea Costa}, title = {A Transparent based Programmable Memory BIST}, journal ={European Test Symposium, IEEE}, volume = {0}, year = {2006}, issn = {1530-1877}, pages = {89-96}, doi = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.7}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - European Test Symposium, IEEE TI - A Transparent based Programmable Memory BIST SN - 1530-1877 SP89 EP96 A1 - Slimane Boutobza, A1 - Michael Nicolaidis, A1 - Kheiredine M. Lamara, A1 - Andrea Costa, PY - 2006 KW - null VL - 0 JA - European Test Symposium, IEEE ER -

Slimane Boutobza, Synopsys Inc, France

Michael Nicolaidis, Tima, France

Kheiredine M. Lamara, Synopsys Inc, France

Andrea Costa, Synopsys Inc, France

We present an original transparent-based programmable memory BIST solution suitable for offline as well as online memory testing. Thanks to an appropriate combination of the test algorithm with the data backgrounds and by providing unlimited background flexibility, the proposed solution allows covering almost all existing fault models while increases the probability to also detect un-modeled faults.

Citation:

Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa, "A Transparent based Programmable Memory BIST," ets, pp.89-96, Eleventh IEEE European Test Symposium (ETS'06), 2006

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