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Towards Measuring Knowledge Management Success
Waikoloa, Big Island, Hawaii January 07-January 10
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/HICSS.2008.461Proceedings of the 41st Annual Hawaii ...
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Murray E. Jennex, Stefan Smolnik, David Croasdell, "Towards Measuring Knowledge Management Success," Hawaii International Conference on System Sciences, pp. 360, Proceedings of the 41st Annual Hawaii International Conference on System Sciences (HICSS 2008), 2008.
 
 
BibTex
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@article{ 10.1109/HICSS.2008.461,
author = {Murray E. Jennex and Stefan Smolnik and David Croasdell},
title = {Towards Measuring Knowledge Management Success},
journal ={Hawaii International Conference on System Sciences},
volume = {0},
year = {2008},
issn = {1530-1605},
pages = {360},
doi = {http://doi.ieeecomputersociety.org/10.1109/HICSS.2008.461},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Hawaii International Conference on System Sciences
TI - Towards Measuring Knowledge Management Success
SN - 1530-1605
SP
EP
A1 - Murray E. Jennex,
A1 - Stefan Smolnik,
A1 - David Croasdell,
PY - 2008
VL - 0
JA - Hawaii International Conference on System Sciences
ER -
 
Discussions at previous HICSS conferences have revealed that there is no general agreement on definitions of knowledge management (KM) and knowledge management system (KMS) success. We developed these concepts and presented them earlier this year. Using an expert panel approach followed by two exploratory surveys, we identify KM success measures. The research demonstrates that measures for KM success are required on multiple dimensions. This paper thus also presents a set of dimensions with measures that can be used to determine if KM in an organization is successful.
Citation:
Murray E. Jennex, Stefan Smolnik, David Croasdell, "Towards Measuring Knowledge Management Success," hicss, pp.360, Proceedings of the 41st Annual Hawaii International Conference on System Sciences (HICSS 2008), 2008
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