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At-Speed Logic BIST Architecture for Multi-Clock Designs
San Jose, California October 02-October 05
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.1192005 International Conference on Comp ...
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Laung-Terng Wang, SynTest Technologies, Inc.
Xiaoqing Wen, Kyushu Institute of Technology, Japan
Po-Ching Hsu, SynTest Technologies, Inc., Taiwan
Shianling Wu, SynTest Technologies, Inc.
Jonhson Guo, SynTest Technologies, Inc., China

This paper presents an at-speed logic BIST architecture for testing multi-clock, multi-frequency designs. The scheme employed allows true at-speed test quality for circuits containing multiple clocks without any clock frequency manipulation. Physical implementation is easily achieved due to the use of a low-speed scan enable (SE) signal and reduced timing-critical design requirements. Application results for two industrial designs are also reported.

Citation:
Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo, "At-Speed Logic BIST Architecture for Multi-Clock Designs," iccd, pp.475-478, 2005 International Conference on Computer Design, 2005
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