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On the Inverse Classification Problem and its Applications
Atlanta, Georgia April 03-April 07
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICDE.2006.10922nd International Conference on Data ...
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Charu C. Aggarwal, Chen Chen, Jiawei Han, "On the Inverse Classification Problem and its Applications," Data Engineering, International Conference on, pp. 111, 22nd International Conference on Data Engineering (ICDE'06), 2006.
 
 
BibTex
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@article{ 10.1109/ICDE.2006.109,
author = {Charu C. Aggarwal and Chen Chen and Jiawei Han},
title = {On the Inverse Classification Problem and its Applications},
journal ={Data Engineering, International Conference on},
volume = {0},
year = {2006},
isbn = {0-7695-2570-9},
pages = {111},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICDE.2006.109},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Data Engineering, International Conference on
TI - On the Inverse Classification Problem and its Applications
SN - 0-7695-2570-9
SP
EP
A1 - Charu C. Aggarwal,
A1 - Chen Chen,
A1 - Jiawei Han,
PY - 2006
KW - Classification
KW - Decision Support
VL - 0
JA - Data Engineering, International Conference on
ER -
 
Charu C. Aggarwal, IBM T. J. Watson Research Center
Chen Chen, University of Illinois at Urbana Champaign
Jiawei Han, University of Illinois at Urbana Champaign
In this paper, we discuss the inverse classification problem, in which we desire to define the features of an incomplete record in such a way that will result in a desired class label. Such an approach is useful in applications in which it is an objective to determine a set of actions to be taken in order to guide the data mining application towards a desired solution. This system can be used for a variety of decision support applications which have pre-determined task criteria.
Index Terms:
Classification, Decision Support
Citation:
Charu C. Aggarwal, Chen Chen, Jiawei Han, "On the Inverse Classification Problem and its Applications," icde, pp.111, 22nd International Conference on Data Engineering (ICDE'06), 2006
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