Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit

Beijing, China August 30-September 01

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http://doi.ieeecomputersociety.org/10.1109/ICICIC.2006.113

First International Conference on Inn ...

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	ASCII Text	x
	Yuh-Yih Lu, Zhi-Hua Chen, Chung-Hsiung Yeh, Hsiang-Cheh Huang, "Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit," Innovative Computing ,Information and Control, International Conference on, vol. 1, pp. 113-116, First International Conference on Innovative Computing, Information and Control - Volume I (ICICIC'06), 2006.

	BibTex	x
	@article{ 10.1109/ICICIC.2006.113, author = {Yuh-Yih Lu and Zhi-Hua Chen and Chung-Hsiung Yeh and Hsiang-Cheh Huang}, title = {Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit}, journal ={Innovative Computing ,Information and Control, International Conference on}, volume = {1}, year = {2006}, isbn = {0-7695-2616-0}, pages = {113-116}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICICIC.2006.113}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Innovative Computing ,Information and Control, International Conference on TI - Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit SN - 0-7695-2616-0 SP113 EP116 A1 - Yuh-Yih Lu, A1 - Zhi-Hua Chen, A1 - Chung-Hsiung Yeh, A1 - Hsiang-Cheh Huang, PY - 2006 KW - null VL - 1 JA - Innovative Computing ,Information and Control, International Conference on ER -

Yuh-Yih Lu, Minghsin University of Science and Technology, Taiwan, R.O.C.

Zhi-Hua Chen, Minghsin University of Science and Technology, Taiwan, R.O.C.

Chung-Hsiung Yeh, Minghsin University of Science and Technology, Taiwan, R.O.C.

Hsiang-Cheh Huang, National University of Kaohsiung, Taiwan, R.O.C.

In general, the conducted electromagnetic interference (EMI) emission exists in most of the electronic products and affects the electromagnetic environments. In this paper, we design a switching circuit to observe and improve the conducted EMI emission. We also discuss the conducted EMI effects with putting RC snubber or diode into the switching circuit. It is found that the switching circuits with RC snubber or diode can reduce the conducted EMI effect and accord with the limitations of FCC Part 15 Class B and EN 55011 Class B.

Citation:

Yuh-Yih Lu, Zhi-Hua Chen, Chung-Hsiung Yeh, Hsiang-Cheh Huang, "Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit," icicic, vol. 1, pp.113-116, First International Conference on Innovative Computing, Information and Control - Volume I (ICICIC'06), 2006

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