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A New Study on Distance Metrics as Similarity Measurement
Toronto, ON, Canada July 09-July 12
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICME.2006.2624432006 IEEE International Conference on ...
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Jie Yu, Department of Computer Science, University of Texas at San Antonio
Jaume Amores, IMEDIA Research Group, INRIA, Rocquencourt, France
Nicu Sebe, Faculty of Science, University of Amsterdam
Qi Tian, Department of Computer Science, University of Texas at San Antonio
Distance metric is widely used in similarity estimation. In this paper we find that the most popular Euclidean and Manhattan distance may not be suitable for all data distributions. A general guideline to establish the relation between a distribution model and its corresponding similarity estimation is proposed. Based on Maximum Likelihood theory, we propose new distance metrics, such as harmonic distance and geometric distance. Because the feature elements may be from heterogeneous sources and usually have different influence on similarity estimation, it is inappropriate to model the distribution as isotropic. We propose a novel boosted distance metric that not only finds the best distance metric that fits the distribution of the underlying elements but also selects the most important feature elements with respect to similarity. The boosted distance metric is tested on fifteen benchmark data sets from the UCI repository and two image retrieval applications. In all the experiments, robust results are obtained based on the proposed methods.
Citation:
Jie Yu, Jaume Amores, Nicu Sebe, Qi Tian, "A New Study on Distance Metrics as Similarity Measurement," icme, pp.533-536, 2006 IEEE International Conference on Multimedia and Expo, 2006
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