Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe

April 13-April 18

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/ICONS.2008.61

Third International Conference on Sys ...

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Rafic Bachnak Articles by Scott King

	ASCII Text	x
	Rafic Bachnak, Scott King, "Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe," Systems, Second International Conference on, pp. 134-139, Third International Conference on Systems (icons 2008), 2008.

	BibTex	x
	@article{ 10.1109/ICONS.2008.61, author = {Rafic Bachnak and Scott King}, title = {Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe}, journal ={Systems, Second International Conference on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3105-2}, pages = {134-139}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICONS.2008.61}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Systems, Second International Conference on TI - Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe SN - 978-0-7695-3105-2 SP134 EP139 A1 - Rafic Bachnak, A1 - Scott King, PY - 2008 KW - null VL - 0 JA - Systems, Second International Conference on ER -

Rafic Bachnak

Scott King

This paper describes the development of an eddy current prototype that combines positional and eddy-current data to produce a C-scan of tested material. The preliminary system consists of an eddy current probe, a position tracking mechanism, and basic data visualization capability. Test results of the prototype are presented and briefly discussed.

Citation:

Rafic Bachnak, Scott King, "Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe," icons, pp.134-139, Third International Conference on Systems (icons 2008), 2008

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.