H. Wu, Q. Chen, M. Yachida,
"Facial Feature Extraction and Face Verification,"
Pattern Recognition, International Conference on, vol. 3, pp. 484, 13th International Conference on Pattern Recognition (ICPR'96) - Volume 3, 1996.
BibTex
x
@article{
10.1109/ICPR.1996.546994, author = {H. Wu and Q. Chen and M. Yachida}, title = {Facial Feature Extraction and Face Verification}, journal ={Pattern Recognition, International Conference on}, volume = {3}, year = {1996}, issn = {1051-4651}, pages = {484}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1996.546994}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Pattern Recognition, International Conference on TI - Facial Feature Extraction and Face Verification SN - 1051-4651 SP EP A1 - H. Wu, A1 - Q. Chen, A1 - M. Yachida, PY - 1996 VL - 3 JA - Pattern Recognition, International Conference on ER -
H. Wu, Q. Chen, M. Yachida, "Facial Feature Extraction and Face Verification," icpr, vol. 3, pp.484, 13th International Conference on Pattern Recognition (ICPR'96) - Volume 3, 1996
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