Farzin Mokhtarian, Riku Suomela,
"Curvature Scale Space for Robust Image Corner Detection,"
Pattern Recognition, International Conference on, vol. 2, pp. 1819, 14th International Conference on Pattern Recognition (ICPR'98) - Volume 2, 1998.
BibTex
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@article{
10.1109/ICPR.1998.712083, author = {Farzin Mokhtarian and Riku Suomela}, title = {Curvature Scale Space for Robust Image Corner Detection}, journal ={Pattern Recognition, International Conference on}, volume = {2}, year = {1998}, issn = {1051-4651}, pages = {1819}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1998.712083}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Pattern Recognition, International Conference on TI - Curvature Scale Space for Robust Image Corner Detection SN - 1051-4651 SP EP A1 - Farzin Mokhtarian, A1 - Riku Suomela, PY - 1998 VL - 2 JA - Pattern Recognition, International Conference on ER -
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