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Blur and Affine Moment Invariants
Quebec City, QC, Canada August 11-August 15
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.104746516th International Conference on Patt ...
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Tomáš Suk, Jan Flusser, "Blur and Affine Moment Invariants," Pattern Recognition, International Conference on, vol. 4, pp. 40339, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 4, 2002.
 
 
BibTex
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@article{ 10.1109/ICPR.2002.1047465,
author = {Tomáš Suk and Jan Flusser},
title = {Blur and Affine Moment Invariants},
journal ={Pattern Recognition, International Conference on},
volume = {4},
year = {2002},
issn = {1051-4651},
pages = {40339},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1047465},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Pattern Recognition, International Conference on
TI - Blur and Affine Moment Invariants
SN - 1051-4651
SP
EP
A1 - Tomáš Suk,
A1 - Jan Flusser,
PY - 2002
KW - null
VL - 4
JA - Pattern Recognition, International Conference on
ER -
 
Tomáš Suk, Academy of Sciences of the Czech Republic
Jan Flusser, Academy of Sciences of the Czech Republic
The paper is devoted to the recognition of objects and patterns deformed by imaging geometry as well as by unknown blurring. We introduce a new lass of features invariant simultaneously to blurring by a centrosymmetri PSF and to affine transformation. As we prove in the paper, they can be constructed by combining affine moment invariants and blur invariants derived earlier. Combined invariants allow to recognize objects in the degraded scene without any restoration and geometric normalization.
Citation:
Tomáš Suk, Jan Flusser, "Blur and Affine Moment Invariants," icpr, vol. 4, pp.40339, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 4, 2002
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