DVHMM: Variable Length Text Recognition Error Model

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http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1047807

16th International Conference on Patt ...

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	Atsuhiro Takasu, Kenro Aihara, "DVHMM: Variable Length Text Recognition Error Model," Pattern Recognition, International Conference on, vol. 3, pp. 30110, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 3, 2002.

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	@article{ 10.1109/ICPR.2002.1047807, author = {Atsuhiro Takasu and Kenro Aihara}, title = {DVHMM: Variable Length Text Recognition Error Model}, journal ={Pattern Recognition, International Conference on}, volume = {3}, year = {2002}, issn = {1051-4651}, pages = {30110}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1047807}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

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	TY - CONF JO - Pattern Recognition, International Conference on TI - DVHMM: Variable Length Text Recognition Error Model SN - 1051-4651 SP EP A1 - Atsuhiro Takasu, A1 - Kenro Aihara, PY - 2002 KW - null VL - 3 JA - Pattern Recognition, International Conference on ER -

Atsuhiro Takasu, National Institute of Informatics

Kenro Aihara, National Institute of Informatics

This paper proposes a text recognition error model called the dual variable length output hidden Markov model (DVHMM) and gives a parameter estimation algorithm based on the EM algorithm. Although existing probabilistic error models are limited to substitution (1,1), insertion (1,0), and deletion (0,1) errors, the DVHMM can handle error patterns of any pair (i, j) of lengths including substitution, insertion, and deletion.

Citation:

Atsuhiro Takasu, Kenro Aihara, "DVHMM: Variable Length Text Recognition Error Model," icpr, vol. 3, pp.30110, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 3, 2002

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