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Estimating Cast Shadows using SFS and Class-based Surface Completion
Hong Kong August 20-August 24
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.49818th International Conference on Patt ...
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William A. P. Smith, Edwin R. Hancock, "Estimating Cast Shadows using SFS and Class-based Surface Completion," Pattern Recognition, International Conference on, vol. 4, pp. 86-90, 18th International Conference on Pattern Recognition (ICPR'06) Volume 4, 2006.
 
 
BibTex
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@article{ 10.1109/ICPR.2006.498,
author = {William A. P. Smith and Edwin R. Hancock},
title = {Estimating Cast Shadows using SFS and Class-based Surface Completion},
journal ={Pattern Recognition, International Conference on},
volume = {4},
year = {2006},
issn = {1051-4651},
pages = {86-90},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.498},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Pattern Recognition, International Conference on
TI - Estimating Cast Shadows using SFS and Class-based Surface Completion
SN - 1051-4651
SP86
EP90
A1 - William A. P. Smith,
A1 - Edwin R. Hancock,
PY - 2006
KW - null
VL - 4
JA - Pattern Recognition, International Conference on
ER -
 
William A. P. Smith, University of York,York, YO10 5DD, UK
Edwin R. Hancock, University of York,York, YO10 5DD, UK
This paper describes a method for cast shadow removal from obliquely illuminated images of faces. The method draws on a statistical model of surface normal directions. The model is fitted to shadowed facial images using robust statistics and constraints provided by shape-from-shading. Regions associated with poor fit residuals are associated with shadow regions. We illustrate the method on the Yale B database where it gives both good shadow map estimates and fills-in the facial surface in the shadow regions.
Citation:
William A. P. Smith, Edwin R. Hancock, "Estimating Cast Shadows using SFS and Class-based Surface Completion," icpr, vol. 4, pp.86-90, 18th International Conference on Pattern Recognition (ICPR'06) Volume 4, 2006
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