loading...
Feature Selection based on the Bhattacharyya Distance
Hong Kong August 20-August 24
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.55718th International Conference on Patt ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Guorong Xuan, Tongji University, Shanghai, China
Xiuming Zhu, Tongji University, Shanghai, China
Peiqi Chai, Tongji University, Shanghai, China
Zhenping Zhang, Tongji University, Shanghai, China
Yun Q. Shi, New Jersey Institute of Technology Newark, NJ 07102, USA
Dongdong Fu, New Jersey Institute of Technology Newark, NJ 07102, USA
This paper presents a Bhattacharyya distance based feature selection method, which utilizes a recursive algorithm to obtain the optimal dimension reduction matrix in terms of the minimum upper bound of classification error under normal distribution for multi-class classification problem. In our scheme, PCA is incorporated as a pre-processing to reduce the intractably heavy computation burden of the recursive algorithm. The superior experimental results on the handwritten-digit recognition with the MNIST database and the steganalysis applications have demonstrated the effectiveness of our proposed method.
Citation:
Guorong Xuan, Xiuming Zhu, Peiqi Chai, Zhenping Zhang, Yun Q. Shi, Dongdong Fu, "Feature Selection based on the Bhattacharyya Distance," icpr, vol. 4, pp.957, 18th International Conference on Pattern Recognition (ICPR'06) Volume 4, 2006
Usage of this product signifies your acceptance of the Terms of Use.


Suggestions