Finding Symmetry Plane of 3D Face Shape

Hong Kong August 20-August 24

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http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.565

18th International Conference on Patt ...

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	ASCII Text	x
	Gang Pan, Yueming Wang, Yipeng Qi, Zhaohui Wu, "Finding Symmetry Plane of 3D Face Shape," Pattern Recognition, International Conference on, vol. 3, pp. 1143-1146, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006.

	BibTex	x
	@article{ 10.1109/ICPR.2006.565, author = {Gang Pan and Yueming Wang and Yipeng Qi and Zhaohui Wu}, title = {Finding Symmetry Plane of 3D Face Shape}, journal ={Pattern Recognition, International Conference on}, volume = {3}, year = {2006}, issn = {1051-4651}, pages = {1143-1146}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.565}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Pattern Recognition, International Conference on TI - Finding Symmetry Plane of 3D Face Shape SN - 1051-4651 SP1143 EP1146 A1 - Gang Pan, A1 - Yueming Wang, A1 - Yipeng Qi, A1 - Zhaohui Wu, PY - 2006 KW - null VL - 3 JA - Pattern Recognition, International Conference on ER -

Gang Pan, Zhejiang University, Hangzhou, 310027, China

Yueming Wang, Zhejiang University, Hangzhou, 310027, China

Yipeng Qi, Zhejiang University, Hangzhou, 310027, China

Zhaohui Wu, Zhejiang University, Hangzhou, 310027, China

The symmetry plane detection from 3D face shape is much helpful for pose estimation and feature extraction for a wide range of applications, e.g. 3D face recognition. This paper proposes a robust symmetry plane detection method for 3D face models, which is an extension of EGI-based approach. The experiments using two data sets, USF HumanID 3D face database and 3DFED database covering significant variation in facial expression, demonstrate the effectiveness.

Citation:

Gang Pan, Yueming Wang, Yipeng Qi, Zhaohui Wu, "Finding Symmetry Plane of 3D Face Shape," icpr, vol. 3, pp.1143-1146, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006

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