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An Approach to Test Data Generation for Killing Multiple Mutants
Philadelphia, Pennsylvania September 24-September 27
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICSM.2006.1322nd IEEE International Conference on ...
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Ming-Hao Liu, Peking University, Beijing, 100871, China
You-Feng Gao, Peking University, Beijing, 100871, China
Jin-Hui Shan, Peking University, Beijing, 100871, China
Jiang-Hong Liu, Peking University, Beijing, 100871, China
Lu Zhang, Peking University, Beijing, 100871, China
Jia-Su Sun, Peking University, Beijing, 100871, China
Software testing is an important technique for assurance of software quality. Mutation testing has been identified as a powerful fault-based technique for unit testing, and there has been some research on automatic generation of test data for mutation testing. However, existing approaches to this kind of test data generation usually generate test data according to one mutant at one time. Thus, more test data that are needed for achieving a given mutation score. In this paper, we propose a new approach to generating one test data according to multiple mutants that are mutated at the same location at one time. Thus, our approach can generate smaller test suite that can achieve the same mutation testing score. To evaluate our approach, we implemented a prototype tool based on our approach and carried out some preliminary experiments. The experimental results show that our approach is more cost-effective.
Index Terms:
unit testing, mutation testing, test data generation, adequacy criterion
Citation:
Ming-Hao Liu, You-Feng Gao, Jin-Hui Shan, Jiang-Hong Liu, Lu Zhang, Jia-Su Sun, "An Approach to Test Data Generation for Killing Multiple Mutants," icsm, pp.113-122, 22nd IEEE International Conference on Software Maintenance (ICSM'06), 2006
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