Programmable cellular automata based testbed for fault diagnosis in VLSI circuits

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http://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489456

9th International Conference on VLSI ...

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	S. Nandi, S. Chattopadhyay, P.P. Chandhuri, "Programmable cellular automata based testbed for fault diagnosis in VLSI circuits," VLSI Design, International Conference on, pp. 61, 9th International Conference on VLSI Design: VLSI in Mobile Communication, 1996.

	BibTex	x
	@article{ 10.1109/ICVD.1996.489456, author = {S. Nandi and S. Chattopadhyay and P.P. Chandhuri}, title = {Programmable cellular automata based testbed for fault diagnosis in VLSI circuits}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {1996}, issn = {1063-9667}, pages = {61}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489456}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Programmable cellular automata based testbed for fault diagnosis in VLSI circuits SN - 1063-9667 SP EP A1 - S. Nandi, A1 - S. Chattopadhyay, A1 - P.P. Chandhuri, PY - 1996 KW - cellular automata; fault diagnosis; logic testing; VLSI; integrated circuit testing; logic partitioning; automatic testing; programmable cellular automata; fault diagnosis; VLSI circuits; signature analyzer; polynomial algebraic tools; faulty signatures; partitions; multiple attractor; fault dictionary size; cascadable structure VL - 0 JA - VLSI Design, International Conference on ER -

S. Nandi, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Guwahati, India

S. Chattopadhyay, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Guwahati, India

P.P. Chandhuri, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Guwahati, India

This paper analyses the fault diagnosis capability of Programmable CA based signature analyzer. Polynomial algebraic tools have been developed for selection of a group CA of appropriate size for generation of faulty signatures due to faults in different partitions of a circuit. Further, a special class of CA termed as multiple attractor CA has been utilized for classification of faulty signatures that leads to unambiguous diagnosis of faulty partition(s). This classification has resulted in phenomenal reduction of fault dictionary size to the order of number of partitions in the circuit. Experiments conducted on some real-life and benchmark circuits establishes the simple, modular, and cascadable structure of CA as an efficient tool for fault diagnosis in VLSI circuits.

Index Terms:

cellular automata; fault diagnosis; logic testing; VLSI; integrated circuit testing; logic partitioning; automatic testing; programmable cellular automata; fault diagnosis; VLSI circuits; signature analyzer; polynomial algebraic tools; faulty signatures; partitions; multiple attractor; fault dictionary size; cascadable structure

Citation:

S. Nandi, S. Chattopadhyay, P.P. Chandhuri, "Programmable cellular automata based testbed for fault diagnosis in VLSI circuits," vlsid, pp.61, 9th International Conference on VLSI Design: VLSI in Mobile Communication, 1996

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