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Design of a Measurement and Interface Integrated Circuit for Characterization of Switched Current Memory Cells
India January 04-January 07
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.1998.646610Eleventh International Conference on ...
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Adriano M. Pereira, Tales C. Pimenta, Robson L. Moreno, Edgar Charry R., Alberto M. Jorge, "Design of a Measurement and Interface Integrated Circuit for Characterization of Switched Current Memory Cells," VLSI Design, International Conference on, pp. 240, Eleventh International Conference on VLSI Design: VLSI for Signal Processing, 1998.
 
 
BibTex
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@article{ 10.1109/ICVD.1998.646610,
author = {Adriano M. Pereira and Tales C. Pimenta and Robson L. Moreno and Edgar Charry R. and Alberto M. Jorge},
title = {Design of a Measurement and Interface Integrated Circuit for Characterization of Switched Current Memory Cells},
journal ={VLSI Design, International Conference on},
volume = {0},
year = {1998},
issn = {1063-9667},
pages = {240},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1998.646610},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Design, International Conference on
TI - Design of a Measurement and Interface Integrated Circuit for Characterization of Switched Current Memory Cells
SN - 1063-9667
SP
EP
A1 - Adriano M. Pereira,
A1 - Tales C. Pimenta,
A1 - Robson L. Moreno,
A1 - Edgar Charry R.,
A1 - Alberto M. Jorge,
PY - 1998
KW - switched current
KW - behaviour simulation
KW - voltage-to-current converter
VL - 0
JA - VLSI Design, International Conference on
ER -
 
Adriano M. Pereira, Gurpo de Microeletr?nica
Tales C. Pimenta, Gurpo de Microeletr?nica
Robson L. Moreno, Gurpo de Microeletr?nica
Edgar Charry R., Div. de Microeletr?nica, CPqD
Alberto M. Jorge, DEMIC - FEEC - UNICAMP
Dynamic current mirrors, or SI memory cells, are widely used in analog signal processing circuits. They could be implemented using a standard cell methodology if an SI cell library is available. Aiming the creation of that library, this work presents the design of the measuring system and the interface circuit (on chip) necessary to test SI cells with precision of 450 ppm and operation frequency of 3MHz. Measurements performed on the prototypes show that the harmonics components and the noise level are 70dB smaller than the fundamental and the total harmonic distortion is 0.04%.
Index Terms:
switched current, behaviour simulation, voltage-to-current converter
Citation:
Adriano M. Pereira, Tales C. Pimenta, Robson L. Moreno, Edgar Charry R., Alberto M. Jorge, "Design of a Measurement and Interface Integrated Circuit for Characterization of Switched Current Memory Cells," vlsid, pp.240, Eleventh International Conference on VLSI Design: VLSI for Signal Processing, 1998
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