loading...
Estimation of Switching Noise on Power Supply Lines in Deep Sub-micron CMOS Circuits
Calcutta, India January 04-January 07
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2000.81260413th International Conference on VLSI ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Shiyou Zhao, Purdue University
Kaushik Roy, Purdue University
To achieve high performance and high integration density, the transistor dimensions are aggressively scaled down while lower power dissipation is achieved by scaling down the supply voltage. However, power distribution has become a challenging issue due to the severe switching noise on the power distribution network. Estimation of the worst case switching noise is essential to ensure the proper functionality of the VLSI circuits.In this paper, we propose a probabilistic approach to determine the worst case switching noise on power supply lines. The proposed algorithm traces the worst case input patterns which will induce the steepest maximum switching current spike and therefore the maximum switching noise. The worst case input patterns are used in the HSPICE simulation to extract the exact switching current waveforms. The estimated maximum switching current spike matches well with the peak current obtained from the HSPICE simulation. The worst case switching noise due to the lumped inductance (including the packaging inductance) and the lumped resistance on the power supply grid is also extracted from the HSPICE simulation. The magnitude of the worst case switching noise for the benchmark circuits implemented with 0.25 micron technology can be as high as 35\% of the Vdd. The switching noise can be suppressed effectively with properly placed decoupling capacitors.
Index Terms:
switching noise, Ldi/dt noise, maximum switching current, IR voltage drop
Citation:
Shiyou Zhao, Kaushik Roy, "Estimation of Switching Noise on Power Supply Lines in Deep Sub-micron CMOS Circuits," vlsid, pp.168, 13th International Conference on VLSI Design, 2000
Usage of this product signifies your acceptance of the Terms of Use.