A Review of DASIE Code Family: Contribution to SEU/MBU Understanding

Saint Raphael, French Riviera, France July 06-July 08

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http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.12

11th IEEE International On-Line Testi ...

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	G. Hubert, N. Buard, C. Weulersse, T. Carriere, M.-C. Palau, J.-M. Palau, D. Lambert, J. Baggio, F. Wrobel, F. Saigne, R. Gaillard, "A Review of DASIE Code Family: Contribution to SEU/MBU Understanding," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 87-94, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.12, author = {G. Hubert and N. Buard and C. Weulersse and T. Carriere and M.-C. Palau and J.-M. Palau and D. Lambert and J. Baggio and F. Wrobel and F. Saigne and R. Gaillard}, title = {A Review of DASIE Code Family: Contribution to SEU/MBU Understanding}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {87-94}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.12}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - A Review of DASIE Code Family: Contribution to SEU/MBU Understanding SN - 1530-1591 SP87 EP94 A1 - G. Hubert, A1 - N. Buard, A1 - C. Weulersse, A1 - T. Carriere, A1 - M.-C. Palau, A1 - J.-M. Palau, A1 - D. Lambert, A1 - J. Baggio, A1 - F. Wrobel, A1 - F. Saigne, A1 - R. Gaillard, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

G. Hubert, EADS, Corporate Research Center

N. Buard, EADS, Corporate Research Center

C. Weulersse, EADS, Corporate Research Center

T. Carriere, EADS, Space Transportation

M.-C. Palau, EADS, Space Transportation

J.-M. Palau, University of Montpellier

D. Lambert, CEA/DAM

J. Baggio, CEA/DAM

F. Wrobel, University of Nice

F. Saigne, University of Montpellier

R. Gaillard, NFODUC

DASIE (the Detailed Analysis of Secondary Ion Effect) is the name of a code family dedicated to the SEE rate prediction. This paper presents a review of DASIE code family and its contributions to SEU (Single Event Upset) and MBU (Multiple Bit Upset) understanding.

Citation:

G. Hubert, N. Buard, C. Weulersse, T. Carriere, M.-C. Palau, J.-M. Palau, D. Lambert, J. Baggio, F. Wrobel, F. Saigne, R. Gaillard, "A Review of DASIE Code Family: Contribution to SEU/MBU Understanding," iolts, pp.87-94, 11th IEEE International On-Line Testing Symposium, 2005

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