T. M. Mak, Subhasish Mitra, Ming Zhang,
"DFT Assisted Built-In Soft Error Resilience,"
IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 69, 11th IEEE International On-Line Testing Symposium, 2005.
BibTex
x
@article{
10.1109/IOLTS.2005.23, author = {T. M. Mak and Subhasish Mitra and Ming Zhang}, title = {DFT Assisted Built-In Soft Error Resilience}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {69}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.23}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - DFT Assisted Built-In Soft Error Resilience SN - 1530-1591 SP EP A1 - T. M. Mak, A1 - Subhasish Mitra, A1 - Ming Zhang, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -
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