T. M. Mak,
"Does It Mean Less Testing for Self Calibrating Design?,"
IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 99, 11th IEEE International On-Line Testing Symposium, 2005.
BibTex
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@article{
10.1109/IOLTS.2005.24, author = {T. M. Mak}, title = {Does It Mean Less Testing for Self Calibrating Design?}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {99}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.24}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - Does It Mean Less Testing for Self Calibrating Design? SN - 1530-1591 SP EP A1 - T. M. Mak, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -
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