Evaluation of SET and SEU Effects at Multiple Abstraction Levels

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http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.28

11th IEEE International On-Line Testi ...

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	ASCII Text	x
	L. Anghel, R. Leveugle, P. Vanhauwaert, "Evaluation of SET and SEU Effects at Multiple Abstraction Levels," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 309-312, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.28, author = {L. Anghel and R. Leveugle and P. Vanhauwaert}, title = {Evaluation of SET and SEU Effects at Multiple Abstraction Levels}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {309-312}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.28}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - Evaluation of SET and SEU Effects at Multiple Abstraction Levels SN - 1530-1591 SP309 EP312 A1 - L. Anghel, A1 - R. Leveugle, A1 - P. Vanhauwaert, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

L. Anghel, TIMA Laboratory

R. Leveugle, TIMA Laboratory

P. Vanhauwaert, TIMA Laboratory

This paper reviews the main approaches used to evaluate the effect of Single Event Transients and Single Event Upsets in digital circuits described at different abstraction levels. The two fault models are first discussed with respect to the circuit description levels, then complementary dependability evaluation methods are summarized.

Citation:

L. Anghel, R. Leveugle, P. Vanhauwaert, "Evaluation of SET and SEU Effects at Multiple Abstraction Levels," iolts, pp.309-312, 11th IEEE International On-Line Testing Symposium, 2005

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