Impact of Soft Error Challenge on SoC Design

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http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.36

11th IEEE International On-Line Testi ...

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	Y. Zorian, V. A. Vardanian, K. Aleksanyan, K. Amirkhanyan, "Impact of Soft Error Challenge on SoC Design," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 63-68, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.36, author = {Y. Zorian and V. A. Vardanian and K. Aleksanyan and K. Amirkhanyan}, title = {Impact of Soft Error Challenge on SoC Design}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {63-68}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.36}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - Impact of Soft Error Challenge on SoC Design SN - 1530-1591 SP63 EP68 A1 - Y. Zorian, A1 - V. A. Vardanian, A1 - K. Aleksanyan, A1 - K. Amirkhanyan, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

Y. Zorian, Virage Logic Corporation

V. A. Vardanian, Virage Logic Yerevan Branch

K. Aleksanyan, Virage Logic Yerevan Branch

K. Amirkhanyan, Virage Logic Yerevan Branch

Soft errors are a major challenge to robust design. Conventionally, designs with high level requirements for reliability and availability required protection against soft errors. However, the scaling level reached with today's nanometer technologies is moving the soft error protection requirements to SoC designs for a wide range of applications. This paper discusses the soft error challenge, its implication on SoC design practices and possible approaches to create a robust SoC design.

Citation:

Y. Zorian, V. A. Vardanian, K. Aleksanyan, K. Amirkhanyan, "Impact of Soft Error Challenge on SoC Design," iolts, pp.63-68, 11th IEEE International On-Line Testing Symposium, 2005

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