Modeling of Transients Caused by a Laser Attack on Smart Cards

Saint Raphael, French Riviera, France July 06-July 08

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http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.43

11th IEEE International On-Line Testi ...

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	Damien Leroy, Stanisław J. Piestrak, Fabrice Monteiro, Abbas Dandache, "Modeling of Transients Caused by a Laser Attack on Smart Cards," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 193-194, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.43, author = {Damien Leroy and Stanisław J. Piestrak and Fabrice Monteiro and Abbas Dandache}, title = {Modeling of Transients Caused by a Laser Attack on Smart Cards}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {193-194}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.43}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - Modeling of Transients Caused by a Laser Attack on Smart Cards SN - 1530-1591 SP193 EP194 A1 - Damien Leroy, A1 - Stanisław J. Piestrak, A1 - Fabrice Monteiro, A1 - Abbas Dandache, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

Damien Leroy, iRoC Technologies SA

Stanisław J. Piestrak, University of Metz

Fabrice Monteiro, University of Metz

Abbas Dandache, University of Metz

Several techniques for extracting data from smart cards have been described in the literature, including the so called differential fault analysis (DFA) that relies on perturbing the chip operations to deduce the data. In this paper, we present some experimental results of the DFA that relies on using a laser beam.

Citation:

Damien Leroy, Stanisław J. Piestrak, Fabrice Monteiro, Abbas Dandache, "Modeling of Transients Caused by a Laser Attack on Smart Cards," iolts, pp.193-194, 11th IEEE International On-Line Testing Symposium, 2005

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