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On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations
Saint Raphael, French Riviera, France July 06-July 08
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.5111th IEEE International On-Line Testi ...
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V. Ocheretnij, G. Kouznetsov, R. Karri, M. G?ssel, "On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 141-146, 11th IEEE International On-Line Testing Symposium, 2005.
 
 
BibTex
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@article{ 10.1109/IOLTS.2005.51,
author = {V. Ocheretnij and G. Kouznetsov and R. Karri and M. G?ssel},
title = {On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations},
journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2005},
issn = {1530-1591},
pages = {141-146},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.51},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International
TI - On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations
SN - 1530-1591
SP141
EP146
A1 - V. Ocheretnij,
A1 - G. Kouznetsov,
A1 - R. Karri,
A1 - M. G?ssel,
PY - 2005
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International
ER -
 
V. Ocheretnij, University of Potsdam
G. Kouznetsov, University of Potsdam
R. Karri, Polytechnic University
M. G?ssel, University of Potsdam

In this paper we experimentally investigate the efficiency of concurrent checking for the AES encryption algorithm (Rijndael) by parity modification according to [3]. Also we propose a simple new BIST method. For BIST the implementation of the AES algorithm itself is used as well as a pseudo-random test input generator and a compactor of the test results. Thereby we utilized the property of the AES algorithm that arbitrarily given plain texts are encrypted by the successive rounds into "pseudo-random" cipher texts which are the (test) inputs for the next round.

The complete data path of the AES algorithm is simulated as a netlist of AND-, NAND-, OR-, NOR- and XOR-gates. All possible single stuck-at faults are injected and simulated. For a special implementation of the S-boxes all errors within the data path of the AES algorithm due to single stuck-at faults are immediately detected.

Citation:
V. Ocheretnij, G. Kouznetsov, R. Karri, M. G?ssel, "On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations," iolts, pp.141-146, 11th IEEE International On-Line Testing Symposium, 2005
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