Laurent Sourgen,
"Security Constraints in Integrated Circuits,"
IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 117, 11th IEEE International On-Line Testing Symposium, 2005.
BibTex
x
@article{
10.1109/IOLTS.2005.61, author = {Laurent Sourgen}, title = {Security Constraints in Integrated Circuits}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {117}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.61}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - Security Constraints in Integrated Circuits SN - 1530-1591 SP EP A1 - Laurent Sourgen, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -
PDF
IEEE Xplore Subscribers
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb