With ongoing technology scaling, reliability is becoming increasingly important for integrated circuits (ICs) manufactured in deep-submicron CMOS technologies. The reliability issue that generally leads to the highest failure rates is that of radiation-induced soft errors. Both alpha particles, emitted by chip and package materials, and cosmic neutrons are capable of inducing bit errors in ICs. These are named "soft errors" because the data is corrupted but the device itself is not damaged. Problems can be expected to occur in large systems, e.g., in high-end servers with large memory caches. Also for products with stringent reliability constraints, e.g., in the medical and the automotive domain, the soft-error rate (SER) could be an issue. Even if a product has an apparently low SER, it may be applied in a larger system where its contribution to the system failure rate is unacceptably high. Nowadays more and more customers demand SER specifications for the products offered by integrated device manufacturers (IDMs).