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A systematic approach for Failure Modes and Effects Analysis of System-On-Chips
Heraklion, Crete, Greece July 08-July 11
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.1013th IEEE International On-Line Testi ...
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R. Mariani, G. Boschi, "A systematic approach for Failure Modes and Effects Analysis of System-On-Chips," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 187-188, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.
 
 
BibTex
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@article{ 10.1109/IOLTS.2007.10,
author = {R. Mariani and G. Boschi},
title = {A systematic approach for Failure Modes and Effects Analysis of System-On-Chips},
journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2007},
isbn = {0-7695-2918-6},
pages = {187-188},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.10},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International
TI - A systematic approach for Failure Modes and Effects Analysis of System-On-Chips
SN - 0-7695-2918-6
SP187
EP188
A1 - R. Mariani,
A1 - G. Boschi,
PY - 2007
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International
ER -
 
R. Mariani, YOGITECH, Italy
G. Boschi, YOGITECH, Italy
This paper proposes a method to perform Failure Mode and Effects Analysis (FMEA) on System-On- Chips (SoC). An automatic tool extracts information from the SoC description and uses them to estimate the intrinsic criticality of invariant and elementary "sensitive zones" and to compute metrics such failure rates, safe failures fraction and diagnostic coverage. A validation flow based on fault injection and fault simulation is included to cross check the FMEA.
Citation:
R. Mariani, G. Boschi, "A systematic approach for Failure Modes and Effects Analysis of System-On-Chips," iolts, pp.187-188, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
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