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Design for Resilience to Soft Errors and Variations
Heraklion, Crete, Greece July 08-July 11
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.2613th IEEE International On-Line Testi ...
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Ming Zhang, T.M. Mak, Jim Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu, "Design for Resilience to Soft Errors and Variations," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 23-28, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.
 
 
BibTex
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@article{ 10.1109/IOLTS.2007.26,
author = {Ming Zhang and T.M. Mak and Jim Tschanz and Kee Sup Kim and Norbert Seifert and Davia Lu},
title = {Design for Resilience to Soft Errors and Variations},
journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2007},
isbn = {0-7695-2918-6},
pages = {23-28},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.26},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International
TI - Design for Resilience to Soft Errors and Variations
SN - 0-7695-2918-6
SP23
EP28
A1 - Ming Zhang,
A1 - T.M. Mak,
A1 - Jim Tschanz,
A1 - Kee Sup Kim,
A1 - Norbert Seifert,
A1 - Davia Lu,
PY - 2007
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International
ER -
 
Ming Zhang, Intel Corporation
T.M. Mak, Intel Corporation
Jim Tschanz, Intel Corporation
Kee Sup Kim, Intel Corporation
Norbert Seifert, Intel Corporation
Davia Lu, Intel Corporation
This paper presents Adaptive Variation-and-Error- Resilient Agent (AVERA), an approach to address the challenge of designing reliable systems in the presence of soft errors and variations. AVERA extends our previous Built-In Soft Error Resilience (BISER) approach by adding additional capabilities to support process variation diagnosis, degradation detection, and system adaptation, besides soft error correction. We also discuss open challenges for building variation-and-error-resilient systems.
Citation:
Ming Zhang, T.M. Mak, Jim Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu, "Design for Resilience to Soft Errors and Variations," iolts, pp.23-28, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
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