loading...
Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment
Heraklion, Crete, Greece July 08-July 11
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.3613th IEEE International On-Line Testi ...
 This Article 
 
PURCHASE ARTICLE: $0
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
X. Cano, U. Barcelona, Spain
S. Bota, GTE, U. Illes Balears
R. Graciani, U. Barcelona, Spain
D. Gasc?, U. Barcelona, Spain
A. Herms, U. Barcelona, Spain
A. Comerma, U. Barcelona, Spain
J. Segura, GET, U. Illes Balears.
L. Garrido, U. Barcelona, Spain
A heavy ion radiation test has been performed to evaluate the SEU sensitivity on a mixed-mode ASIC. We present the results obtained when the Triple Voting Registers used in the digital block of the ASIC are irradiated with heavy ions.
Citation:
X. Cano, S. Bota, R. Graciani, D. Gasc?, A. Herms, A. Comerma, J. Segura, L. Garrido, "Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment," iolts, pp.183-184, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
Usage of this product signifies your acceptance of the Terms of Use.