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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Heraklion, Crete, Greece July 08-July 11
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.5513th IEEE International On-Line Testi ...
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Antonis Papanikolaou, IMEC, Belgium
Hua Wang, IMEC, Belgium
Miguel Miranda, IMEC, Belgium
Francky Catthoor, IMEC, Belgium
Embedded system design is especially demanding in terms of requirements that need to be satisfied, e.g. real-time processing, cost effectiveness, low energy consumption and reliable operation. These requirements have to be properly balanced until a financially viable global solution is found. Novel mobile multimedia and communication applications pose extremely severe requirements on the amount of storage, processing and functionality capabilities of the system. Near future embedded systems will have to combine interactive gaming with advanced 3D and video codecs together with leading edge wireless connectivity standards, like software defined radio front-ends and protocol stacks for cognitive radio. This will increase the platform requirements by at least a factor of 10. Meanwhile, battery capacity is only increasing by about 7% per year and users demand longer times between battery recharges. Optimizing any one of these requirements by compromising on another is a rather straightforward design task. In embedded system design the solution must obey the constraints in all four requirement axes.
Citation:
Antonis Papanikolaou, Hua Wang, Miguel Miranda, Francky Catthoor, "Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design," iolts, pp.121, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
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