A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors

Heraklion, Crete, Greece July 08-July 11

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http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.9

13th IEEE International On-Line Testi ...

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	Marta Portela-Garcia, Celia L?pez-Ongil, Mario Garcia-Valderas, Luis Entrena, "A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 101-106, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.

	BibTex	x
	@article{ 10.1109/IOLTS.2007.9, author = {Marta Portela-Garcia and Celia L?pez-Ongil and Mario Garcia-Valderas and Luis Entrena}, title = {A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2007}, isbn = {0-7695-2918-6}, pages = {101-106}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.9}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors SN - 0-7695-2918-6 SP101 EP106 A1 - Marta Portela-Garcia, A1 - Celia L?pez-Ongil, A1 - Mario Garcia-Valderas, A1 - Luis Entrena, PY - 2007 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

Marta Portela-Garcia, Carlos III University of Madrid, Spain

Celia L?pez-Ongil, Carlos III University of Madrid, Spain

Mario Garcia-Valderas, Carlos III University of Madrid, Spain

Luis Entrena, Carlos III University of Madrid, Spain

Processors are very common components in current digital systems and to assess their reliability is an essential task during the design process. In this paper a new fault injection solution to measure SEU sensitivity in processors is presented. It consists in a hardware-implemented module that performs fault injection through the available JTAG-based On-Chip Debugger (OCD). It can be widely applicable to different processors since JTAG standard is an extended interface and OCDs are usually available in current processors. The hardware implementation avoids the communication between the target system and the software debugging tool. The method has been applied to a complex processor, the ARM7TDMI. Results illustrate the approach is a fast, efficient and cost-effective solution.

Citation:

Marta Portela-Garcia, Celia L?pez-Ongil, Mario Garcia-Valderas, Luis Entrena, "A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors," iolts, pp.101-106, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

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