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An Integrated Defect Tracking Model for Product Deployment in Telecom Services
Cartagena, Murcia, Spain June 27-June 30
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISCC.2005.2910th IEEE Symposium on Computers and ...
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D. A. Hoeflin, M. H. Sherif, "An Integrated Defect Tracking Model for Product Deployment in Telecom Services," Computers and Communications, IEEE Symposium on, pp. 927-932, 10th IEEE Symposium on Computers and Communications (ISCC'05), 2005.
 
 
BibTex
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@article{ 10.1109/ISCC.2005.29,
author = {D. A. Hoeflin and M. H. Sherif},
title = {An Integrated Defect Tracking Model for Product Deployment in Telecom Services},
journal ={Computers and Communications, IEEE Symposium on},
volume = {0},
year = {2005},
issn = {1530-1346},
pages = {927-932},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISCC.2005.29},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Computers and Communications, IEEE Symposium on
TI - An Integrated Defect Tracking Model for Product Deployment in Telecom Services
SN - 1530-1346
SP927
EP932
A1 - D. A. Hoeflin,
A1 - M. H. Sherif,
PY - 2005
KW - null
VL - 0
JA - Computers and Communications, IEEE Symposium on
ER -
 
D. A. Hoeflin, AT&T Labs
M. H. Sherif, AT&T Labs
This paper presents a new reliability model for the time series of failures uncovered during testing of software products. The time series can be either an S-shaped curve or a slowing exponential. The model is statistically consistent; the variance of the estimated number of failures tends to zero as the test time increases. This model can be used for managing risks in the deployment of new products that support highly reliable telecommunication services.
Citation:
D. A. Hoeflin, M. H. Sherif, "An Integrated Defect Tracking Model for Product Deployment in Telecom Services," iscc, pp.927-932, 10th IEEE Symposium on Computers and Communications (ISCC'05), 2005
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