loading...
Advanced statistical Computing for Capacitance Tomography as a Monitoring and Control Tool
Wroclaw, Poland September 08-September 10
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISDA.2005.195th International Conference on Intel ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
K. Grudzien, Technical University of Lodz, Poland
A. Romanowski, Technical University of Lodz, Poland
D. Sankowski, Technical University of Lodz, Poland
R. G. Aykroyd, University of Leeds, UK
R. A. Williams, University of Leeds, UK
Advanced statistical modelling such as Bayesian framework is a powerful methodology and gives great flexibility in terms of physical phenomena modelling. Unfortunately it is usually associated with very time and resource consuming computing. Therefore it was avoided by engineers in the past. Nowadays, rapid development of computer capabilities enables use of such methods. Algorithms reported here are based on Markov chain Monte Carlo (MCMC) methods applied to Bayesian modelling. The important factor is highly iterative approach enabling direct desired parameters estimation, hence omitting the phase of image reconstruction. This property has an important feature of making feasible implementation of automatic industrial process control systems based on process tomography.
Citation:
K. Grudzien, A. Romanowski, D. Sankowski, R. G. Aykroyd, R. A. Williams, "Advanced statistical Computing for Capacitance Tomography as a Monitoring and Control Tool," isda, pp.49-54, 5th International Conference on Intelligent Systems Design and Applications (ISDA'05), 2005
Usage of this product signifies your acceptance of the Terms of Use.