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Reduced Test Application Time Based on Reachability Analysis
San Jose, California March 21-March 23
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.102Sixth International Symposium on Qual ...
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Th. Haniotakis, S. Tragoudas, G. Pani, "Reduced Test Application Time Based on Reachability Analysis," Quality Electronic Design, International Symposium on, pp. 232-237, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005.
 
 
BibTex
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@article{ 10.1109/ISQED.2005.102,
author = {Th. Haniotakis and S. Tragoudas and G. Pani},
title = {Reduced Test Application Time Based on Reachability Analysis},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2005},
isbn = {0-7695-2301-3},
pages = {232-237},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.102},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Reduced Test Application Time Based on Reachability Analysis
SN - 0-7695-2301-3
SP232
EP237
A1 - Th. Haniotakis,
A1 - S. Tragoudas,
A1 - G. Pani,
PY - 2005
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Th. Haniotakis, Southern Illinois University Carbondale
S. Tragoudas, Southern Illinois University Carbondale
G. Pani, Southern Illinois University Carbondale
A test application method to reduce the test application time in full scan designs is presented. It can be used either during or after the test pattern generation phase so that one or more patterns can be reached from an already scanned pattern using scan reapply or scan shift operations. The presented approach is based on established methods for reachability analysis in sequential verification and a fault grading algorithm to ensure that all targeted faults are covered.
Citation:
Th. Haniotakis, S. Tragoudas, G. Pani, "Reduced Test Application Time Based on Reachability Analysis," isqed, pp.232-237, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005
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