Jiaxing Sun, Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
Yun Zheng, CEC Huada Electronic Design Co., Ltd., Beijing, China
Qing Ye, Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
Tianchun Ye, Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
Efficient and highly accurate interconnect delay and slew computation is critical for physical synthesis and static timing analysis. Elmore delay is simple and closed-form metric, but it has too low accuracy. Some higher order moments metrics such as AWE can have high accuracy, but we cannot afford their calculation speeds. In this paper we propose two closed-form delay metrics and two closed-from slew metrics using the first three moments, which can be used for both step input and ramp input.
Index Terms:
D3M, ID3M, SS3M, SIS3M
Citation:
Jiaxing Sun, Yun Zheng, Qing Ye, Tianchun Ye, "Interconnect Delay and Slew Metrics Using the First Three Moments," isqed, pp.598-602, Sixth International Symposium on Quality of Electronic Design (ISQED'05), 2005