Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs

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http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.25

7th International Symposium on Qualit ...

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	Daniela De Venuto, Leonardo Reyneri, "Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs," Quality Electronic Design, International Symposium on, pp. 537-542, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006.

	BibTex	x
	@article{ 10.1109/ISQED.2006.25, author = {Daniela De Venuto and Leonardo Reyneri}, title = {Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2006}, isbn = {0-7695-2523-7}, pages = {537-542}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.25}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs SN - 0-7695-2523-7 SP537 EP542 A1 - Daniela De Venuto, A1 - Leonardo Reyneri, PY - 2006 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Daniela De Venuto, Politecnico di Bari, Italy

Leonardo Reyneri, Politecnico di Torino, Italy

This work describes an intensive investigation on the test strategy known as polynomial fitting that uses FPGA generated stimuli for cheap and fast testing of high resolution ADC?s. Simulation and experimental results showed a sensitivity on the specifications parameters detection of 90dB. The proposed method can also help to control the cost of ADC production test, extends the test coverage and enable built-in self-test and test-based selfcalibration.

Citation:

Daniela De Venuto, Leonardo Reyneri, "Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs," isqed, pp.537-542, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006

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